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gate delay中文是什么意思

  • 门信号延迟
  • 门延迟
  • 选通延迟

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  • 例句与用法
  • Trigger gate delay
    触发门脉冲延迟
  • The problem in high speed signal process , such as parasitic parameter and gate delay is also the difficulty hi the research
    生成高速,稳定的时钟信号是本课题的目标。高速信号处理所遇到的常见问题,如寄生参数,门电路延迟是设计难点。
  • Due to the subtle error among different manufacturing equipment , the gate delay of circuits is different and varies in a given scope , which induces the time uncertainty of the waveform
    由于制造设备本身存在微小误差,具体门的延时并不相同,而是在一定范围内变化,引起波形变化的时间不确定。
  • This paper constructs a stable rlc interconnect model based on the first three moments of the node admittance , and discusses its application to interconnect delay and logic gate delay estimation
    摘要基于rlc互连树节点导纳的低阶矩构建了一种稳定的互连模型,并讨论了它在互连树延时和逻辑门延时估计中的应用。
  • When the silicon technology comes to deep sub - micron level , the interconnect delay exceeds the gate delay ; and because of the increase of 1c work frequency , the allowable errors become smaller , and the influence of the transmission delay gets bigger , which increase the difficulty of the circuit design
    在深亚微米制造技术中,芯片互连线延迟超过门延迟,而且随着集成电路工作频率的提高,允许的时序容差变小,传输延迟的影响加大,设计工作难度增加。
  • An algorithm of path - based timing optimization by buffer insertion is presented . the algorithm adopts a high order model to estimate interconnect delay and a nonlinear delay model based on look - up table for gate delay estimation . and heuristic method of buffer insertion is presented to reduce delay . the algorithm is tested by industral circuit case . experimental results show that the algorithm can optimize the timing of circuit efficiently and the timing constraint is satisfied
    提出了一种基于路径的缓冲器插入时延优化算法,算法采用高阶模型估计连线时延,用基于查表的非线性时延模型估计门延迟.在基于路径的时延分析基础上,提出了缓冲器插入的时延优化启发式算法.工业测试实例实验表明,该算法能够有效地优化电路时延,满足时延约束
  • In this paper an fault simulator for iddt testing is presented , which can detect concurrently the multi - faults . due to the subtle error among equipment manufacturing , the gate delays of circuits are not the same but range within limits . which induces the uncertainty of the waveform transforming time
    本文从故障激活的条件入手,利用五值逻辑,对瞬态电流测试中的延时变化进行波形分析和波形计算,采用并发模拟算法,编程实现了一个iddt测试的故障模拟器。实际电路中由于制造工艺的限制,逻辑门的延时并不相同,而是在一定范围内变化,引起波形变化的时间不确定。
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Last modified time:Sat, 16 Aug 2025 00:29:56 GMT

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